For hardware and electronics manufacturers, test data is often one of the richest sources of operational insight. It shows which units passed, which units failed, which measurements were taken, which limits were applied, which stations were involved and whether a product was retested, repaired or released.
The problem is that this data rarely starts in one clean system.
It is often spread across LabVIEW, TestStand, CSV files, SQL databases, spreadsheets, MES exports, repair logs, RMA records and custom scripts. Each source may be useful on its own, but the value is limited if teams cannot connect results across the wider production workflow.