Yield and failure trends
Which products, stations, steps or time periods are driving the largest yield losses?
AI Analysis
Ask questions across scattered test results, failure patterns, retests, stations, units, repair notes and engineering context.
It needs more than access to dashboards, spreadsheets or manuals. It needs structured test data, product context, version awareness, traceability and the engineering knowledge behind recurring failures.
For hardware and electronics manufacturers, the assistant should understand how test results relate to units, stations, test steps, limits, measurements, retests, repairs, firmware, software versions and quality workflows.
The goal is not to let AI guess. The goal is to let teams ask better questions across data they already generate.
Which products, stations, steps or time periods are driving the largest yield losses?
Which test steps generate the most retests, and are they linked to specific stations, limits or fixtures?
What happened to this serial number across test, retest, repair, firmware and release?
Are field failures or repairs linked to marginal production test results or known failure signatures?
Generic AI assistants struggle because manufacturing test data is not just text. It is structured, time-based, version-dependent and tied to physical products, stations and processes.
A useful assistant must know the difference between:
Without that structure, the assistant becomes another interface over messy data.
Helps engineers ask questions across test results, limits, failures, stations, retests and sequence versions.
Helps quality teams investigate recurring defects, trace units, review repair patterns and prepare quality summaries.
Helps production and operations teams understand yield trends, station issues, throughput blockers and recurring test failures.
Connects structured test data with known issues, investigation notes, repair context and previous engineering explanations.
Ask which products, stations, limits or sequence versions are associated with a recurring failure.
Summarise yield movement by product, line, station, batch or time period.
Identify test steps with high retest rates and investigate whether failures are linked to marginal limits or station variation.
Review the full test and repair history for a specific serial number or batch.
Compare repair findings against original production test signatures to identify missed warning signs.
Generate structured summaries for production reviews, supplier discussions or customer quality updates.
Arc connects existing test outputs such as LabVIEW, TestStand, CSV files, SQL databases, spreadsheets, MES exports and custom reports.
Arc organises data around products, units, stations, test steps, measurements, limits, failures, retests, repairs and versions.
Arc links test data with known issues, repair notes, investigation summaries, procedures and support knowledge.
Teams can ask questions across the connected layer instead of manually searching dashboards, spreadsheets and disconnected systems.
Arc starts with the structure of the test data and engineering context behind the assistant. It is designed for environments where analysis depends on products, units, stations, test steps, limits, retests, repairs, firmware and software versions.
A generic chatbot can summarise documents. Arc is intended to help teams ask operational questions across the data and knowledge involved in manufacturing test workflows.
For the supporting data layer, see AI-ready test data, manufacturing test data analytics and test data management.
Read more about ai-ready test data for manufacturing teams.
GuideRead more about engineering knowledge capture for test data.
ExplainerRead more about why dashboards and pdf chatbots are not enough for test data.
HubRead more about manufacturing test data resources.
It is an assistant that helps teams ask questions across production test results, yield, failures, retests, traceability, repair notes and engineering context.
Yes. Arc is intended to work with existing test outputs such as LabVIEW files, TestStand reports, CSV files, SQL databases, spreadsheets and manufacturing exports.
Yes. Arc can help teams ask questions about yield movement, first pass failures, recurring test issues, station variation and retest patterns.
Where the underlying data is available, Arc can help connect unit or serial-level test history with retests, repairs, firmware, release state and quality context.
No. Arc focuses on structuring the test data and engineering context behind the assistant so teams can ask more reliable operational questions.
No. Arc should be positioned as connecting and structuring existing data sources, not replacing every test system, spreadsheet, dashboard or MES.
See how Arc connects test results, failure patterns, repair notes and engineering context into an AI-ready analysis layer.
Request Access